Jason
28a66889ad
Complete test infrastructure for the observe-before-fix methodology: - stm32_hal_mock: HAL stub types + spy/recording ring buffer (512 entries) - ad_driver_mock: ADF4382/AD9523 mock drivers with configurable returns - 9 shim headers redirecting real #includes to mock types - Makefile with individual (test_bug1..8) and aggregate (test) targets All 8 tests pass, confirming: #1 Timed sync init ordering (SetupTimedSync before initialized=true) #2 AD9523 double setup (first call before reset release) #3 TriggerTimedSync no-op (prints messages, no HW action) #4 Phase shift before init error check #5 SetFinePhaseShift GPIO-only placeholder (no PWM) #6 Timer variable collision (last_check vs last_check1) #7 GPIO pin mapping conflict (manager.h vs CubeMX main.h) #8 uart_print/uart_println commented out
19 lines
599 B
C
19 lines
599 B
C
/* shim: diag_log.h -- disable DIAG macros for test builds */
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#ifndef DIAG_LOG_H_SHIM
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#define DIAG_LOG_H_SHIM
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/* Silence all DIAG output during unit tests */
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#define DIAG_DISABLE
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#define DIAG(tag, fmt, ...) ((void)0)
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#define DIAG_WARN(tag, fmt, ...) ((void)0)
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#define DIAG_ERR(tag, fmt, ...) ((void)0)
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#define DIAG_REG(tag, name, val) ((void)0)
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#define DIAG_REG32(tag, name, val) ((void)0)
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#define DIAG_GPIO(tag, name, port, pin) ((void)0)
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#define DIAG_BOOL(tag, name, val) ((void)0)
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#define DIAG_SECTION(name) ((void)0)
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#define DIAG_ELAPSED(tag, name, t) ((void)0)
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#endif
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